RF Component testing is done by SIGIS to stress-test RF devices to ensure that they will perform up to the standards that you expect.

We use a well-instrumented, flexible and controllable system to be able to give a wide variety of load conditions, and able to run both high voltage and current that can be used to test for failure modes, or to drive design improvements.

We consider this type of testing to be at the very heart of our efforts to deliver high-quality RF devices, and can perform testing on such varied devices as capacitors,  RF feedthroughs, and even up to matching networks and RF generators at a variety of frequencies.